| Autor: |
Wietfeldt FE; Tulane University, New Orleans, LA 70118., Dewey MS; National Institute of Standards and Technology, Gaithersburg, MD 20899., Gilliam DM; National Institute of Standards and Technology, Gaithersburg, MD 20899., Nico JS; National Institute of Standards and Technology, Gaithersburg, MD 20899., Fei X; Indiana University, Bloomington, IN 47408., Snow WM; Indiana University, Bloomington, IN 47408., Greene GL; University of Tennessee/Oak Ridge National Laboratory, Knoxville, TN 37996., Pauwels J; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium., Eykens R; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium., Lamberty A; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium., Van Gestel J; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium. |
