Physical modeling of interference enhanced imaging and characterization of single nanoparticles.

Autor: Avci O, Adato R, Ozkumur AY, Ünlü MS
Jazyk: angličtina
Zdroj: Optics express [Opt Express] 2016 Mar 21; Vol. 24 (6), pp. 6094-114.
DOI: 10.1364/OE.24.006094
Abstrakt: Interferometric imaging schemes have gained significant interest due to their superior sensitivity over imaging techniques that are solely based on scattered signal. In this study, we outline the theoretical foundations of imaging and characterization of single nanoparticles in an interferometric microscopy scheme, examine key parameters that influence the signal, and benchmark the model against experimental findings.
Databáze: MEDLINE