| Autor: |
Kholid FN; Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, 637371, Singapore. Surface Technology Group, Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, 638075, Singapore., Huang H, Zhang Y, Fan HJ |
| Jazyk: |
angličtina |
| Zdroj: |
Nanotechnology [Nanotechnology] 2016 Jan 15; Vol. 27 (2), pp. 025703. Date of Electronic Publication: 2015 Dec 02. |
| DOI: |
10.1088/0957-4484/27/2/025703 |
| Abstrakt: |
The failure of a silver nanowire (AgNW) random network due to high electric current density is described. The AgNW network breaks down as result of electromigration and Joule heating at junctions, which leads to destroyed interconnections between AgNWs. The AgNW network is not completely destroyed after breakdown, but instead is able to undergo multiple breakdowns after being cooled down, with increased resistance and reduced breakdown current density. The breakdown current density of AgNW network is J(max) = 25 A cm(-2) for a network with R(s) ~ 40 Ω sq(-1) outperforming a CuNW network. An effective electrical annealing method is demonstrated to decrease network resistance by 18% by periodically applying high current that is slightly lower than breakdown current with a period of 1 min for a few cycles. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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