An integrated data analysis tool for improving measurements on the MST RFP.

Autor:	Reusch LM; Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Galante ME; Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Franz P; Consorzio RFX, EURATOM-ENEA Association, Padova, Italy., Johnson JR; Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., McGarry MB; Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Stephens HD; Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA., Den Hartog DJ; Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.
Jazyk:	angličtina
Zdroj:	The Review of scientific instruments [Rev Sci Instrum] 2014 Nov; Vol. 85 (11), pp. 11D844.
DOI:	10.1063/1.4886957
Abstrakt:	Many plasma diagnostics contain complementary information. For example, the double-foil soft x-ray system (SXR) and the Thomson Scattering diagnostic (TS) on the Madison Symmetric Torus both measure electron temperature. The complementary information from these diagnostics can be combined using a systematic method based on integrated data analysis techniques, leading to more accurate and sensitive results. An integrated data analysis tool based on Bayesian probability theory was able to estimate electron temperatures that are consistent with both the SXR and TS diagnostics and more precise than either. A Markov Chain Monte Carlo analysis to increase the flexibility of the tool was implemented and benchmarked against a grid search method.
Databáze:	MEDLINE
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