| Autor: |
Kryzhanovskaya NV, Mukhin IS, Moiseev EI, Shostak II, Bogdanov AA, Nadtochiy AM, Maximov MV, Zhukov AE, Kulagina MM, Vashanova KA, Zadiranov YM, Troshkov SI, Lipovskii AA, Mintairov A |
| Jazyk: |
angličtina |
| Zdroj: |
Optics express [Opt Express] 2014 Oct 20; Vol. 22 (21), pp. 25782-7. |
| DOI: |
10.1364/OE.22.025782 |
| Abstrakt: |
Focused ion beam is applied to quantum dot based microresonators to form pits or groove on their surface. The emission spectra of the resonators based lasers are significantly thinned out after the ion beam milling, and one or two modes become dominant instead of a group of modes having comparable intensities. The linewidth of the lasing mode is kept unchanged, whereas the lasing threshold demonstrates an insignificant growth. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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