Sidewall gratings in ultra-low-loss Si3N4 planar waveguides.

Autor: Belt M; Electrical and Computer Engineering Department, University of California, Santa Barbara California 93106, USA. michaelbelt@ece.ucsb.edu, Bovington J, Moreira R, Bauters JF, Heck MJ, Barton JS, Bowers JE, Blumenthal DJ
Jazyk: angličtina
Zdroj: Optics express [Opt Express] 2013 Jan 14; Vol. 21 (1), pp. 1181-8.
DOI: 10.1364/OE.21.001181
Abstrakt: We demonstrate sidewall gratings in an ultra-low-loss Si3N4 planar waveguide platform. Through proper geometrical design we can achieve coupling constant values between 13 and 310 cm(-1). The TE waveguide propagation loss over the range of 1540 to 1570 nm is below 5.5 dB/m.
Databáze: MEDLINE