Nanoscale spin wave localization using ferromagnetic resonance force microscopy.

Autor: Chia HJ; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA. hanjong.chia@nist.gov, Guo F, Belova LM, McMichael RD
Jazyk: angličtina
Zdroj: Physical review letters [Phys Rev Lett] 2012 Feb 24; Vol. 108 (8), pp. 087206. Date of Electronic Publication: 2012 Feb 24.
DOI: 10.1103/PhysRevLett.108.087206
Abstrakt: We use the dipolar fields from a magnetic cantilever tip to generate localized spin wave precession modes in an in-plane magnetized, thin ferromagnetic film. Multiple resonances from a series of localized modes are detected by ferromagnetic resonance force microscopy and reproduced by micromagnetic models that also reveal highly anisotropic mode profiles. Modeled scans of line defects using the lowest-frequency mode provide resolution predictions of (94.5±1.5) nm in the field direction, and (390±2) nm perpendicular to the field.
Databáze: MEDLINE