| Autor: |
Li W; Beijing National Lab of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, People's Republic of China. liwuxia@aphy.iphy.ac.cn, Fenton JC, Cui A, Wang H, Wang Y, Gu C, McComb DW, Warburton PA |
| Jazyk: |
angličtina |
| Zdroj: |
Nanotechnology [Nanotechnology] 2012 Mar 16; Vol. 23 (10), pp. 105301. Date of Electronic Publication: 2012 Feb 21. |
| DOI: |
10.1088/0957-4484/23/10/105301 |
| Abstrakt: |
We report that, to enable studies of their compositional, structural and electrical properties, freestanding individual nanoobjects can be selectively felled in a controllable way by the technique of low-current focused-ion-beam (FIB) milling with the ion beam at a chosen angle of incidence to the nanoobject. To demonstrate the suitability of the technique, we report results for zigzag/straight tungsten nanowires grown vertically on support substrates and then felled for characterization. We also describe a systematic investigation of the effect of the experimental geometry and parameters on the felling process and on the induced wire-bending phenomenon. The method of felling freestanding nanoobjects using FIB is an advantageous new technique enabling investigations of the properties of selected individual nanoobjects. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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