Matrix-enhanced secondary ion mass spectrometry:  a method for molecular analysis of solid surfaces.

Autor: Wu KJ; Charles Evans & Associates, Redwood City, California 94063., Odom RW
Jazyk: angličtina
Zdroj: Analytical chemistry [Anal Chem] 1996 Mar 01; Vol. 68 (5), pp. 873-82.
DOI: 10.1021/ac950717i
Abstrakt: A new methodology, matrix-enhanced secondary ion mass spectrometry (ME-SIMS), is reported for the molecular analysis of biomaterials. The technique applies static secondary ion mass spectrometry (SSIMS) techniques to samples prepared in a solid organic matrix similar to sample preparations used in matrix-assisted laser desorption/ionization (MALDI). Molecular ions are observed in this ion beam sputtering of organic mixtures for peptides and oligonucleotides up to masses on the order of 10 000 Da. This matrix-enhanced SIMS exhibits substantial increases in the ionization efficiency of selected analyte molecules compared to conventional SSIMS processes. Thus, higher mass peptides, proteins, and nucleic acids become accessible to near-surface analysis by ion beam techniques, and subpicomole sensitivity has been demonstrated. A number of matrices were examined for their efficiency in ME-SIMS applications, and these initial matrix studies focused on common MALDI matrices and their isomers. The results of this survey indicate that 2,5-dihydroxybenzoic acid provides the best general enhancement of molecular secondary ions emitted from analyte/matrix mixtures.
Databáze: MEDLINE