Holographic interferometry: identification of hot spots in a high density circuit board.

Autor: Gupta PC, Aggarwal AK, Shukla VN
Jazyk: angličtina
Zdroj: Applied optics [Appl Opt] 1977 Jul 01; Vol. 16 (7).
DOI: 10.1364/AO.16.1802_1
Databáze: MEDLINE