| Autor: |
Schroer CG; Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany., Boye P, Feldkamp JM, Patommel J, Schropp A, Schwab A, Stephan S, Burghammer M, Schöder S, Riekel C |
| Jazyk: |
angličtina |
| Zdroj: |
Physical review letters [Phys Rev Lett] 2008 Aug 29; Vol. 101 (9), pp. 090801. Date of Electronic Publication: 2008 Aug 29. |
| DOI: |
10.1103/PhysRevLett.101.090801 |
| Abstrakt: |
Coherent x-ray diffraction imaging is an x-ray microscopy technique with the potential of reaching spatial resolutions well beyond the diffraction limits of x-ray microscopes based on optics. However, the available coherent dose at modern x-ray sources is limited, setting practical bounds on the spatial resolution of the technique. By focusing the available coherent flux onto the sample, the spatial resolution can be improved for radiation-hard specimens. A small gold particle (size <100 nm) was illuminated with a hard x-ray nanobeam (E=15.25 keV, beam dimensions approximately 100 x 100 nm2) and is reconstructed from its coherent diffraction pattern. A resolution of about 5 nm is achieved in 600 s exposure time. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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