Characterization of the topography of vacuum-deposited films. 2: Ellipsometry.
| Autor: | Raaijmakers IJ, Verkerk MJ |
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| Jazyk: | angličtina |
| Zdroj: | Applied optics [Appl Opt] 1986 Oct 15; Vol. 25 (20), pp. 3610. |
| DOI: | 10.1364/ao.25.003610 |
| Databáze: | MEDLINE |
| Externí odkaz: |
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