| Autor: |
Giorgetti M; Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Avenue SE, Minneapolis, Minnesota 55455, USA., Passerini S, Smyrl WH, Berrettoni M |
| Jazyk: |
angličtina |
| Zdroj: |
Inorganic chemistry [Inorg Chem] 2000 Apr 03; Vol. 39 (7), pp. 1514-7. |
| DOI: |
10.1021/ic9913233 |
| Abstrakt: |
Polarized X-ray absorption spectroscopy has been used to study the short-range structure of deposited films of V2O5 xerogel. The material is characterized by a layer of VO5 units with the V-O apical bond perpendicular to the basal (xy) plane. We have focused our attention along the z axis. Experiments were carried out by extended X-ray absorption fine structure (EXAFS) spectroscopy in a grazing incidence geometry and showed evidence for close interactions between neighboring layers of V2O5. The structure is described by two sheets of V2O5 facing each other. Fitting of the EXAFS data has confirmed the existence of a vanadium-vanadium interaction between two different V2O5 layers and an oxygen bridge between them. |
| Databáze: |
MEDLINE |
| Externí odkaz: |
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