| Autor: |
Breitenstein, Otwin |
| Další autoři: |
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| Jazyk: |
angličtina |
| Informace o vydání: |
Cham : Springer, 2019. |
| Předmět: |
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| Vydání: |
3rd ed. |
| Druh dokumentu: |
Online; Non-fiction; Electronic document |
| Abstrakt: |
Summary: Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation. |
| Databáze: |
Vybrané kolekce e-knih |
| Externí odkaz: |
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