Test and diagnosis of analogue, mixed-signal and RF integrated circuits. [electronic resource] : the system on chip approach.

Další autoři:	Sun, Yichuang Institution of Engineering and Technology. ProQuest (Firm)
Jazyk:	angličtina
Informace o vydání:	London : Institution of Engineering and Technology, 2008.
Předmět:	Linear integrated circuits -- Testing Mixed signal circuits -- Testing Radio frequency integrated circuits -- Testing Electronic books
Druh dokumentu:	Bibliographies; Electronic; Non-fiction; Electronic document
Databáze:	Vybrané kolekce e-knih
Externí odkaz:	Kolekce e-knih KNAV Registrovani uzivatele: plny text online 5 minut, dalsi pristup na vyzadani. Registered users: full text online 5 minutes, further access on request.