| Abstrakt: |
Abstract: Spectral interference of two beams at the output of a slightly dispersive Michelson interferometer, which leads to an origin of interference fringes over a wide wavelength range, is used to measure the effective thicknesses of optical elements of known dispersion. First, using a Fourier method in processing of the recorded spectral interferograms the ambiguous phase function is obtained. Then, using a simple procedure based on the linear dependence of the optical path difference between beams of the interferometer on the refractive index of material of interferometer elements, the ambiguity of the phase function is removed and the overall effective thickness of the interferometer elements is determined. The method is also used for one case of a more dispersive Michelson interferometer, the effective thickness of its optical elements of known dispersion can be determined by measuring the equalization wavelengths. Good agreement is shown between the values obtained by both methods. |
