Integrated circuit testing for quality assurance in manufacturing: History, current status, and...
| Autor: | Grochowski, Andrew, Bhattacharya, Debashis |
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| Zdroj: | IEEE Transactions on Circuits & Systems Part II: Analog & Digital Signal Processing. Aug97, Vol. 44 Issue 8, p610. 24p. 15 Black and White Photographs, 21 Diagrams, 1 Chart, 2 Graphs. |
| Databáze: | Business Source Ultimate |
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