Track-edge read-write effect of inductive/MR dual element heads.

Autor:	Yuan, Samuel W., Thayamballi, Pradeep
Zdroj:	IEEE Transactions on Magnetics. Sep96, Vol. 32 Issue 5, p3461. 3p. 4 Color Photographs, 3 Graphs.
Databáze:	Business Source Ultimate
Externí odkaz:	Zobrazit plný text záznamu