Electrical measurement of electron and hole mobilities as a function of injection level in silicon.
| Autor: | Bellone, Salvatore, Persiano, Giovanni Vito |
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| Zdroj: | IEEE Transactions on Electron Devices. Sep96, Vol. 43 Issue 9, p1459. 7p. 3 Black and White Photographs, 1 Diagram, 2 Charts, 11 Graphs. |
| Databáze: | Business Source Ultimate |
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