Leakage current mechanism in sub-micron polysilicon thin film transistors.
| Autor: | Olasupo, K.R., Hatalis, M.K. |
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| Zdroj: | IEEE Transactions on Electron Devices. Aug96, Vol. 43 Issue 8, p1218. 6p. 2 Black and White Photographs, 4 Diagrams, 7 Graphs. |
| Databáze: | Business Source Ultimate |
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