Non-Test Cubes for Test Generation Targeting Hard-to-Detect Faults.
| Autor: | Pomeranz, Irith1 |
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| Zdroj: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Dec2013, Vol. 32 Issue 12, p1957-1965. 9p. |
| Databáze: | Business Source Ultimate |
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