Temperature Dependence and Irradiation Response of 1/f-Noise in MOSFETs.
| Autor: | Xiong, H. D., Fleetwood, D. M., Choi, B. K., Sternberg, Andrew L. |
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| Zdroj: | IEEE Transactions on Nuclear Science. Dec2002 Part 1 of 2, Vol. 49 Issue 6, p2718. 6p. 1 Diagram, 8 Graphs. |
| Databáze: | Business Source Ultimate |
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