Impact Ionization and High Field Effects in Wide Band Gap Semiconductors.

Autor: Reigrotzki, M., Madureira, J. R., Kuligk, A., Fitzer, N., Redmer, R., Goodnick, S. M., Dür, M.
Zdroj: International Journal of High Speed Electronics & Systems. Jun2001, Vol. 11 Issue 2, p511. 14p.
Databáze: Business Source Ultimate