Gated-Diode Characterization of the Back-Channel Interface on Irradiated SOI Wafers.
| Autor: | Lawrence, R. K., Ioannou, D. E., Jenkins, W. C., Liu, S. T. |
|---|---|
| Zdroj: | IEEE Transactions on Nuclear Science. Dec2001 Part 1 of 3, Vol. 48 Issue 6, p2140. 6p. 1 Diagram, 9 Graphs. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
|