A Study of Ion Energy and Its Effects Upon an SEGR-Hardened Stripe-Cell MOSFET Technology.
| Autor: | Titus, Jeffrey L., Wheatley, C. Frank, Gillberg, James E., Burton, Donald I. |
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| Zdroj: | IEEE Transactions on Nuclear Science. Dec2001 Part 1 of 3, Vol. 48 Issue 6, p1879. 6p. 2 Black and White Photographs, 1 Chart, 16 Graphs. |
| Databáze: | Business Source Ultimate |
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