Fault Tolerance in Systems Design in VLSI Using Data Compression Under Constraints of Failure Probabilities.
| Autor: | Das, Sunil R., Ramamoorthy, C. V., Assaf, Mansour H., Petriu, Emil M., Jone, Wen-Ben |
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| Zdroj: | IEEE Transactions on Instrumentation & Measurement. Dec2001, Vol. 50 Issue 6, p1725. 23p. 5 Black and White Photographs, 7 Diagrams, 21 Charts. |
| Databáze: | Business Source Ultimate |
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