A Study of Soft and Hard Breakdown--Part II: Principles of Area, Thickness, and Voltage Scaling.
| Autor: | Alam, Muhammad Ashraful, Weir, Bonnie E., Silverman, Paul J. |
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| Zdroj: | IEEE Transactions on Electron Devices. Feb2002, Vol. 49 Issue 2, p239. 8p. 1 Black and White Photograph, 1 Diagram, 18 Graphs. |
| Databáze: | Business Source Ultimate |
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