Test pattern generation for droop faults.
Autor: | Mitra, D.1 debasis.mitra@gmail.com, Sur-Kolay, S.2, Bhattacharya, B. B.2, Kundu, S.3, Nigam, A.4, Dey, S. K.2 |
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Zdroj: | IET Computers & Digital Techniques (Institution of Engineering & Technology). Jul2010, Vol. 4 Issue 4, p274-284. 11p. 5 Diagrams, 2 Charts. |
Databáze: | Business Source Ultimate |
Externí odkaz: |