Test pattern generation for droop faults.

Autor: Mitra, D.1 debasis.mitra@gmail.com, Sur-Kolay, S.2, Bhattacharya, B. B.2, Kundu, S.3, Nigam, A.4, Dey, S. K.2
Zdroj: IET Computers & Digital Techniques (Institution of Engineering & Technology). Jul2010, Vol. 4 Issue 4, p274-284. 11p. 5 Diagrams, 2 Charts.
Databáze: Business Source Ultimate