Dempster-Shafer based multi-view occupancy maps.

Autor: Morbee, M.1 mmorbee@telin.ugent.be, Tessens, L.1, Aghajan, H.2, Philips, W.1
Zdroj: Electronics Letters (Institution of Engineering & Technology). 3/4/2010, Vol. 46 Issue 5, p341-343. 3p. 1 Diagram, 1 Graph.
Databáze: Business Source Ultimate