Universal Damage Factor for Radiation-Induced Dark Current in Silicon Devices.
| Autor: | Srour, J. R., Lo, D. H. |
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| Zdroj: | IEEE Transactions on Nuclear Science. Dec2000 Part 3 of 4, Vol. 47 Issue 6, p2451. 9p. 1 Chart, 4 Graphs. |
| Databáze: | Business Source Ultimate |
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