Measurement of the BJT Activation Current during the Reverse Recovery of Power MOSFET's Drain-Source Diode.

Autor: Iannuzzo, Francesco, Persiano, Giovanni Vito
Zdroj: IEEE Transactions on Electron Devices. Feb2001, Vol. 48 Issue 2, p391. 3p. 1 Diagram, 4 Graphs.
Databáze: Business Source Ultimate