Measurement of the BJT Activation Current during the Reverse Recovery of Power MOSFET's Drain-Source Diode.
Autor: | Iannuzzo, Francesco, Persiano, Giovanni Vito |
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Zdroj: | IEEE Transactions on Electron Devices. Feb2001, Vol. 48 Issue 2, p391. 3p. 1 Diagram, 4 Graphs. |
Databáze: | Business Source Ultimate |
Externí odkaz: |