Multilevel diffractive elements in SiO2 by electron beam lithography and proportional etching with analogue negative resist.

Autor: Laakkonen, Pasi, Lautanen, Jari, Kettunen, Ville, Turunen, Jari, Schirmer, Matthias
Zdroj: Journal of Modern Optics. 07/10/99, Vol. 46 Issue 8, p1295-1307. 13p. 3 Black and White Photographs, 4 Charts, 6 Graphs.
Databáze: Business Source Ultimate