Correlation of Charge Buildup and Stress-Induced Leakage Current in Cerium Oxide Films Grown on Ge (100) Substrates.
| Autor: | Evangelou, Evangelos K.1, Rahman, M Shahinur1, Dimoulas, A.2 |
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| Zdroj: | IEEE Transactions on Electron Devices. Mar2009, Vol. 56 Issue 3, p399-407. 9p. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
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