DICE: A Beneficial Short-Channel Effect in Nanoscale Double-Gate MOSFETs.

Autor: Chouksey, Siddharth1 sidc@tec.ufl.edu, Fossum, Jerry G.1 fossum@tec.ufl.edu
Zdroj: IEEE Transactions on Electron Devices. Mar2008, Vol. 55 Issue 3, p796-802. 7p. 2 Diagrams, 1 Chart, 5 Graphs.
Databáze: Business Source Ultimate