Use of the Radiation-Induced Charge Neutralization Mechanism to Achieve Annealing of 0.35...m SRAMs.
| Autor: | Quittard, O., Joffre, F. |
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| Zdroj: | IEEE Transactions on Nuclear Science. Dec99 Part 1 of 4, Vol. 46 Issue 6, p1633. 7p. 1 Diagram, 4 Charts, 9 Graphs. |
| Databáze: | Business Source Ultimate |
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