Modeling and Characterization of Effects of Dummy-Gate Bias on LDMOSFETs.
Autor: | Marbell, Marvin N.1 mnm5@lehigh.edu, Cherepko, Sergey V.2, Hwang, James C. M.1, Shibib, M. Ayman3, Curtice, Walter R.4 |
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Zdroj: | IEEE Transactions on Electron Devices. Mar2007, Vol. 54 Issue 3, p580-588. 9p. 5 Black and White Photographs, 2 Diagrams, 1 Chart, 9 Graphs. |
Databáze: | Business Source Ultimate |
Externí odkaz: |