Modeling and Characterization of Effects of Dummy-Gate Bias on LDMOSFETs.

Autor: Marbell, Marvin N.1 mnm5@lehigh.edu, Cherepko, Sergey V.2, Hwang, James C. M.1, Shibib, M. Ayman3, Curtice, Walter R.4
Zdroj: IEEE Transactions on Electron Devices. Mar2007, Vol. 54 Issue 3, p580-588. 9p. 5 Black and White Photographs, 2 Diagrams, 1 Chart, 9 Graphs.
Databáze: Business Source Ultimate