Mechanisms for Output Power Expansion and Degradation of PHEMT's During High-Efficiency Operation.
| Autor: | Leoni III, Robert E., Hwang, James C. M. |
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| Zdroj: | IEEE Transactions on Electron Devices. Aug99, Vol. 46 Issue 8, p1608. 6p. 1 Black and White Photograph, 8 Graphs. |
| Databáze: | Business Source Ultimate |
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