Dose-Rate Sensitivity of Modern nMOSFETs.
| Autor: | Witczak, Steven C.1 steven.c.witczak@aero.org, Lacoe, Ronald C.1, Osborn, Jon V.1, Hutson, John M.1, Moss, Steven C.1 |
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| Zdroj: | IEEE Transactions on Nuclear Science. Dec2005 Part 1, Vol. 52 Issue 6, p2602-2608. 7p. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
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