Satisfiability-Based Test Generation for Nonseparable RTL Controller-Datapath Circuits.
| Autor: | Lingappan, Loganathan1, Ravi, Srivaths2, Jha, Niraj K.1 |
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| Zdroj: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Mar2006, Vol. 25 Issue 3, p544-557. 14p. 3 Black and White Photographs, 7 Charts, 10 Graphs. |
| Databáze: | Business Source Ultimate |
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