Experimental and Numerical Investigation on MOSFET's Failure During Reverse Recovery of its...
| Autor: | Busatto, Giovani, Persiano, Giovanni Vito |
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| Zdroj: | IEEE Transactions on Electron Devices. Jun99, Vol. 46 Issue 6, p1268. 6p. 3 Black and White Photographs, 3 Diagrams, 7 Graphs. |
| Databáze: | Business Source Ultimate |
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