Effects of N Distribution on Charge Trapping and TDDB Characteristics of N...O Annealed Wet Oxide.
| Autor: | Mazumder, Motaharul K., Teramoto, Akinobu |
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| Zdroj: | IEEE Transactions on Electron Devices. Jun99, Vol. 46 Issue 6, p1121. 6p. 6 Black and White Photographs, 2 Charts, 5 Graphs. |
| Databáze: | Business Source Ultimate |
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