Process and Design Tradeoffs Between Minimum RC Signal Propagation Delay and Interconnect Current Density and Resistance for Deep Submicrometer ICs.

Autor: Inohara, Masahiro1 masahiro.inohara@toshiba.co.jp, Toyoshima, Yoshiaki1
Zdroj: IEEE Transactions on Electron Devices. Dec2005, Vol. 52 Issue 12, p2634-2639. 6p.
Databáze: Business Source Ultimate