Geometry Optimization of TMR Current Sensors for On-Chip IC Testing.
| Autor: | Phan, Kim Le1, Boeve, Hans1, Vanhelmont, Frederik1, Ikkink, Ton1, Talen, Wim1 |
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| Zdroj: | IEEE Transactions on Magnetics. Oct2005, Vol. 41 Issue 10, p3685-3687. 3p. |
| Databáze: | Business Source Ultimate |
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