A New `Multifrequency' Charge Pumping Technique to Profile Hot-Carrier-Induced Interface-State...
| Autor: | Mahapatra, S., Parikh, C.D. |
|---|---|
| Zdroj: | IEEE Transactions on Electron Devices. May99, Vol. 46 Issue 5, p960. 8p. 3 Black and White Photographs, 2 Diagrams, 2 Charts, 7 Graphs. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
|