Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method.
| Autor: | Sayil, Selahattin1 sayilsx@hal.lamar.edu, Kerns Jr., David. V.2 david.kems@olin.edu, Kerns, Sherra E.2 sherra.kems@olin.edu |
|---|---|
| Zdroj: | IEEE Transactions on Instrumentation & Measurement. Oct2005, Vol. 54 Issue 5, p2082-2089. 8p. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
|