Analysis and Evaluation of Multisite Testing for VLSI.
| Autor: | Hashempour, Hamidreza1 hhashemp@ece.neu.edu, Meyer, Fred J.2 fmeyer@ece.neu.edu, Lombardi, Fabrizio3 lombardi@ece.neu.edu |
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| Zdroj: | IEEE Transactions on Instrumentation & Measurement. Oct2005, Vol. 54 Issue 5, p1770-1778. 9p. |
| Databáze: | Business Source Ultimate |
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