Machine learning-based output prediction of negative capacitance tunnel-FET.
| Autor: | Mukherjee, Adrija1 (AUTHOR), Debnath, Papiya2 (AUTHOR), Chanda, Manash3 (AUTHOR) manash.bst@gmail.com |
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| Zdroj: | International Journal of Electronics. Aug2024, Vol. 111 Issue 8, p1331-1345. 15p. |
| Databáze: | Business Source Ultimate |
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