Low complex CNN for semiconductor wafer defect detection.

Autor:	Midula, P.1 (AUTHOR), Shine, Linu2 (AUTHOR), George, Neetha1 (AUTHOR) neetha@rit.ac.in
Zdroj:	Journal of Intelligent & Fuzzy Systems. Apr2024, p1-9. 9p.
Databáze:	Business Source Ultimate
Externí odkaz:	Zobrazit plný text záznamu