Real-time defect detection of TFT-LCD displays using a lightweight network architecture.

Autor: Chen, Ping1 (AUTHOR), Chen, Mingfang1 (AUTHOR) mfchen111@sina.com, Wang, Sen1 (AUTHOR), Song, Yanjin2 (AUTHOR), Cui, Yu1 (AUTHOR), Chen, Zhongping1 (AUTHOR), Zhang, Yongxia1 (AUTHOR), Chen, Songlin1 (AUTHOR), Mo, Xiang1 (AUTHOR)
Zdroj: Journal of Intelligent Manufacturing. Mar2024, Vol. 35 Issue 3, p1337-1352. 16p.
Databáze: Business Source Ultimate
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