Analysis of Near-IR Photon Emissions From 50-nm n- and p-Channel Si MOSFETs.
| Autor: | De Luna, Noel C.1 jose.noel.c.de.luna@intel.com, Bailon, Michelle F.2 michelle.f.bailon@intel.com, Tarun, Alvarado B.2 alvarado.tarun@intel.com |
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| Zdroj: | IEEE Transactions on Electron Devices. Jun2005, Vol. 52 Issue 6, p1211-1214. 4p. |
| Databáze: | Business Source Ultimate |
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